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Sung Hee Jin

from Washington, DC
Age ~56

Sung Jin Phones & Addresses

  • 1735 Kilbourne Pl NW APT 2, Washington, DC 20010 (202) 306-8500
  • Belmont, CA
  • Los Altos, CA
  • San Francisco, CA
  • Centreville, VA
  • Baltimore, MD
  • Annandale, VA
  • Clifton, VA
  • Silver Spring, MD
  • 1735 Kilbourne Pl NW APT 2, Washington, DC 20010

Work

Company: Harris teeter - Aldie, VA Apr 2013 Position: Fresh food clerk

Education

School / High School: Stratford University- Falls Church, VA Oct 2011 Specialities: Associate of Applied Science in Advanced Culinary Arts

Resumes

Resumes

Sung Jin Photo 1

Sung Jin

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Education:
Sogang University 2010 - 2016
Bachelors, Business
Sung Jin Photo 2

Sung Jin

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Sung Jin Photo 3

Sung Jin Centreville, VA

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Work:
Harris Teeter
Aldie, VA
Apr 2013 to Oct 2013
Fresh food clerk

United States Marine Corps
Camp Lejeune, NC
Feb 2007 to Aug 2009
Company Headquarters Clerk

United States Marine Corps
Camp Lejeune, NC
Aug 2005 to Feb 2007
Warehouse Clerk

Education:
Stratford University
Falls Church, VA
Oct 2011 to Jun 2013
Associate of Applied Science in Advanced Culinary Arts

Art Institute of Washington
Arlington, VA
Dec 2009 to Oct 2011

Centreville High School
Clifton, VA
Sep 2001 to Jun 2004

Publications

Amazon

The Complete Book of Chisanbop : Original Finger Calculation Method

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Chisanbop was created in Korea thirty years ago by Sung Jin Pai. His son, Hang Young Pai, simplified and refined the system, and brought Chisanbop to the United States more than three years ago. Since then, Hang Young Pai has been active nationwide in teaching young children and teachers alike this ...

Author

Hang Young Pai, Sung Jin Pai

Binding

Paperback

Pages

330

Publisher

Van Nostrand Reinhold Company

ISBN #

0442275684

EAN Code

9780442275686

ISBN #

2

Air Cooling Technology for Electronic Equipment

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Clear your bookcase of references containing bits and pieces of useful information and replace them with this thorough, single-volume guide to thermal analysis. Air Cooling Technology for Electronic Equipment is a helpful, practical resource that answers questions frequently asked by thermal and pac...

Binding

Hardcover

Pages

272

Publisher

CRC Press

ISBN #

0849394473

EAN Code

9780849394478

ISBN #

5

Us Patents

Quality Assurance And Reliability Testing Apparatus For Rfid Tags

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US Patent:
20130074607, Mar 28, 2013
Filed:
Sep 22, 2011
Appl. No.:
13/241132
Inventors:
Sung Ryol JIN - Milpitas CA, US
Yong Hyun LEE - Milpitas CA, US
Assignee:
HANA MICRON AMERICA INC. - Milpitas CA
International Classification:
G01N 3/20
US Classification:
73849
Abstract:
A novel RFID tag-bending test apparatus and a related method of using the novel RFID tag-bending test apparatus are disclosed. In one embodiment of the invention, the novel RFID tag-bending test apparatus can place a plurality of RFID tags in corresponding tag holding clips on the novel RFID tag-bending test apparatus to execute a bending test sequence along a particular bending axis for each RFID tag. The bending test sequence can assist identifying defective RFID tags which cannot overcome external bending pressures asserted by the novel RFID tag-bending test apparatus. By excluding these defective RFID tags from a commercial shipment of RFID tags to customers, a manufacturer of RFID tags may be able to reduce a rate of premature RFID tag failures due to external bending pressures in real-life applications of RFID tags, thereby achieving a higher quality assurance and reliability of RFID tags.
Sung Hee Jin from Washington, DC, age ~56 Get Report