Sean Wen Wu from Milpitas, CA, age 59

Professional Records

Medicine Doctors

Dr. Sean M Wu - MD (Doctor of Medicine)

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Hospitals:

265 Campus Dr, Stanford, CA 94305

300 Pasteur Dr, Palo Alto, CA 94304

Massachusetts General Hospital
55 Fruit Street, Boston, MA 02114

Education:

Medical Schools
Duke University
Graduated: 1996

Sean Ming-Yuan Wu

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Specialties:

General Practice
Internal Medicine
Cardiovascular Disease
Cardiology

Education:

Duke University(1999)

Business Records

Name / Title

Company / Classification

Phones & Addresses

Sean Wu

Housen Consulting Services, LLC
Real Estate Investment

139 Coyote Brush, Irvine, CA 92618
13512 Woodglen Dr, Santa Ana, CA 92705

Sean Wu

Nobility Real Estate Investments, LLC
Real Eatate Investments

13512 Woodglen Dr, Santa Ana, CA 92705
139 Coyote Brush, Irvine, CA 92618

Sean Wu
President

Longherb Health Products Inc
Mail Order Quit Smoking Products

4153 Gird Ave, Chino Hills, CA 91709

Sean Wu
President

Wave International Inc
Whol Furniture

20 Descanso Dr, San Jose, CA 95134
1251 Ustilago Dr, San Ramon, CA 94582

Sean Wu
President

JRSH, CORP

1012 S San Gabriel Blvd #857, San Gabriel, CA 91776

Sean X. Wu
President

TWIN-BRIDGE CHINESE CULTURE AND ART CENTER
Beauty Shop

244 Camphor Ave, Fremont, CA 94539

Sean Wu
President

BIO-AGRICULTURAL TECHNOLOGY, INC

187 S Brent Cir, Walnut, CA 91789

Sean Wu
President

AAFP, INC

15420 Shadow Rdg St, Hacienda Heights, CA 91745
15420 Shadow Rdg St, Whittier, CA 91745

Publications

Us Patents

Methods And Systems For Detection Of Selected Defects Particularly In Relatively Noisy Inspection Data

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US Patent:

7373277, May 13, 2008

Filed:

Jun 1, 2004

Appl. No.:

10/858420

Inventors:

Sean Wu - Fremont CA, US
Haiguang Chen - Millbrae CA, US
Michael D. Kirk - San Jose CA, US

Assignee:

KLA-Tencor Technologies Corp. - Milpitas CA

International Classification:

G06F 11/30

US Classification:

702185

Abstract:

Various methods and systems for detection of selected defects particularly in relatively noisy inspection data are provided. One method includes applying a spatial filter algorithm to raw inspection data acquired across an area on a substrate to determine a first portion of the raw inspection data that has a higher probability of being a selected type of defect than a second portion of the raw inspection data. The selected type of defect includes a non-point defect. The method also includes generating a raw two-dimensional map illustrating the first portion of the raw inspection data. In addition, the method includes searching the raw two-dimensional map for an event that has spatial characteristics that approximately match spatial characteristics of the selected type of defect. The method further includes determining if the event corresponds to a defect having the selected type.

Methods And Systems For Detection Of Selected Defects Particularly In Relatively Noisy Inspection Data

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US Patent:

7711521, May 4, 2010

Filed:

May 12, 2008

Appl. No.:

12/119179

Inventors:

Sean Wu - Fremont CA, US
Haiguang Chen - Mountain View CA, US
Michael D. Kirk - San Jose CA, US

Assignee:

KLA-Tencor Technologies Corp. - Milpitas CA

International Classification:

G06F 11/30

US Classification:

702185

Abstract:

Computer-Implemented Methods, Carrier Media, And Systems For Displaying An Image Of At Least A Portion Of A Wafer

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US Patent:

20110304527, Dec 15, 2011

Filed:

Sep 14, 2007

Appl. No.:

11/855581

Inventors:

Sean Wu - Fremont CA, US
Charles Richards - Palo Alto CA, US
Rajagopalan Ramachandran - San Jose CA, US
Min Ouyang - Mountain View CA, US

International Classification:

G09G 3/36

US Classification:

345 92

Abstract:

Various computer-implemented methods, carrier media, and systems for displaying an image of at least a portion of a wafer are provided. One computer-implemented method for displaying an image of at least a portion of a wafer includes separately storing different portions of an image of substantially an entire wafer acquired by inspection of the wafer. The different portions of the image correspond to different areas on the wafer. The method also includes displaying in a user interface (UI) only the different portions requested by a user.

Method And Apparatus For Inspection Of Scattered Hot Spot Areas On A Manufactured Substrate

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US Patent:

20120145894, Jun 14, 2012

Filed:

Dec 13, 2010

Appl. No.:

12/966906

Inventors:

Sean X. WU - Fremont CA, US
Kini VIVEKANAND - Sunnyvale CA, US

International Classification:

G01N 23/00

US Classification:

250307, 250311

Abstract:

One embodiment relates to a method of automated inspection of scattered hot spot areas on a manufactured substrate using an electron beam apparatus. A stage holding the substrate is moved along a swath path so as to move a field of view of the electron beam apparatus such that the moving field of view covers a target area on the substrate. Off-axis imaging of the hot spot areas within the moving field of view is performed. A number of hot spot areas within the moving field of view may be determined, and the speed of the stage movement may be adjusted based on the number of hot spot areas within the moving field of view. Another embodiment relates to an electron beam apparatus for inspecting scattered areas on a manufactured substrate. Other embodiments, aspects and features are also disclosed.