Search

Quan Y Zhang

from Stillwater, OK
Age ~72
Get Report
Also known as:
Quanyu Y Zhang, Quanyu Zhanq, Yu Zhang Quan, Yu Shao Quan
Related to:
Yu Zhang, 49
Connected to:
Agata Zhang, 47Aiguo Zhang, 48Aiyi Zhang, 29Al D Zhang, 55Andi Zhang, 42Angeli W Zhang, 56Bao S ZhangBaoguo Zhang, 54Becky Q Zhang, 68Benyuan Zhang, 61

Quan Zhang Phones & Addresses

  • Stillwater, OK
  • San Francisco, CA
  • 805 Bayshore Blvd, San Mateo, CA 94401 (650) 401-3516

Resumes

Resumes

Quan Zhang Photo 1

Quan Zhang

View page
Quan Zhang Photo 2

Technical Program Manager

View page
Location:
22 Elliott Ave, Bryn Mawr, PA 19010
Industry:
Telecommunications
Work:
Verizon
Technical Program Manager
Intertek Apr 2011 - Sep 2011
Software Qa Engineer
Drexel University Sep 2007 - Jun 2011
Hardware Product Development
Drexel University 2010 - 2011
Rf Graduate Research Assistant
Drexel University 2010 - 2010
Nanophotonics Graduate Research Assistant
Education:
Drexel University 2009 - 2011
Master of Science, Masters, Management, Engineering Drexel University 2006 - 2010
Bachelors, Bachelor of Science, Electrical Engineering
Skills:
Wireless
Rf
Testing
Voip
4G
Engineering
Hardware
Lte
Telecommunications
Gsm
Matlab
Troubleshooting
C
Umts
Cdma
Mobile Devices
Voice Over Ip
Languages:
English
Mandarin
Certifications:
License E 21631
Professional Engineer
Quan Zhang Photo 3

Senior Data Analyst

View page
Location:
527 Elk Ridge Way, San Jose, CA 95136
Industry:
Information Technology And Services
Work:
Tailored Brands, Inc.
Senior Marketing Data Analyst
General Motors Sep 2013 - Sep 2017
Technical Lead
Pwc Aug 2011 - Sep 2013
Forensic Technology Experienced Associate
Shanghai Zhihe Fiber-Reinforced Plastic Companny Jul 2010 - Jul 2010
Temporary Intern
Selex Card Services 2010 - 2010
Practicum Developer and Consultant
Education:
The University of Texas at Austin 2011
Bachelors, Bachelor of Business Administration The University of Texas at Austin - Red Mccombs School of Business Jan 1, 2007 - 2011
Bachelors, Bachelor of Business Administration, Management Shanghai Jiao Tong University 2010 - 2010
Skills:
Sql
Microsoft Excel
Data Analysis
Visual Basic
Microsoft Office
Java
Vba
Business Analysis
Databases
Sql Server
Excel Macros
Microsoft Word
Javascript
Spring Framework
Kendo Ui
Struts
Json
Jquery
Configuration Management
Internet Information Services
Teamcenter Product Cost Management
Python
R
Svn
C#
C++
.Net
Visual Studio
Programming
Access
Asp.net
Vb.net
Ajax
Teamcenter
Visio
Powerpoint
English
Chinese
Mandarin
Spanish
Cascading Style Sheets
Tableau
Power Bi
Pivot Tables
A/B Testing
Interests:
Wushu
Cooking
Snarking at Bad Fiction
Computer Games
Music
Reading Good Fiction
Writing What Comes To My Fancy
Languages:
English
Mandarin
Spanish
Certifications:
Learning R
Excel Vba: Process Modeling
Statistics Foundations: 1
Learning Vba In Excel
Business Analytics: Data Reduction Techniques Using Excel and R
Excel Vba: Managing Files and Data
Tableau 10 Essential Training
Creating Interactive Dashboards In Tableau
Advanced Nosql For Data Science
Tableau 10 For Data Scientists
Integrating Tableau and R For Data Science
Presto Essentials: Data Science
Nosql For Sql Professionals
Learning Python For Data Science, With Tim Fox and Elephant Scale
Quan Zhang Photo 4

Staff Engineer

View page
Location:
Santa Clara, CA
Industry:
Research
Work:
Brion An Asml Company
Staff Engineer
University of Colorado Boulder Aug 2011 - Aug 2012
Research Associate
Brion An Asml Company Aug 2011 - Aug 2012
Senior Engineer Ii
University of Colorado Boulder Aug 2005 - Aug 2011
Graduate Student
Education:
University of Colorado Boulder 2005 - 2011
Doctorates, Doctor of Philosophy, Physics University of Colorado Boulder 2005 - 2007
Master of Science, Masters, Physics University of Science and Technology of China 2001 - 2005
Skills:
Analytical Skills
Data Analysis
Liquid Crystals
Matlab
Comsol
Microsoft Excel
Microsoft Office
C/C++ Progamming
Mathematica
Materials Science
Computer Simulation
Photolithography
Quan Zhang Photo 5

Private Investor

View page
Industry:
Investment Management
Work:
Gp Capital Co., Ltd
Private Investor
Education:
The Hong Kong Polytechnic University 2010 - 2011
Master of Business Administration, Masters Fudan University 2006 - 2010
Skills:
管理人员
Microsoft Excel
Microsoft Word
顾客服务
战略规划
Microsoft Powerpoint
领导力
Quan Zhang Photo 6

Financial Reporting Manager

View page
Location:
San Francisco, CA
Work:
Xilinx
Financial Reporting Manager
Quan Zhang Photo 7

Quan Zhang

View page
Location:
San Francisco, CA
Industry:
Accounting
Work:
Deloitte
Audit Intern
Aegon Nederland Jun 2005 - Feb 2012
Assistant Manager, Corporate Communication
Deloitte Jun 2005 - Feb 2012
Auditor
Education:
San Jose State University 2013 - 2014
Master of Science, Masters, Accountancy Fudan University 2007 - 2011
Masters, Economics, Finance East China Normal University 2000 - 2004
Bachelors, Bachelor of Law, Law
Skills:
Leadership
Teamwork
Administrative Management
Microsoft Excel
Corporate Communications
Marketing Event Planning
Languages:
English
Mandarin
Quan Zhang Photo 8

Equity Analyst

View page
Location:
San Francisco, CA
Industry:
Investment Management
Work:
Artisan Partners
Equity Analyst
Piper Jaffray 2005 - 2007
Research Analyst
Education:
The University of Chicago Booth School of Business 2003 - 2005
Master of Business Administration, Masters, Finance Texas A&M University 1994 - 1996
Master of Science, Masters

Publications

Us Patents

Method For Determining A Mask Pattern Comprising Optical Proximity Corrections Using A Trained Machine Learning Model

View page
US Patent:
20230100578, Mar 30, 2023
Filed:
Feb 4, 2021
Appl. No.:
17/796751
Inventors:
- Veldhoven, NL
Jun TAO - Cupertino CA, US
Quan ZHANG - San Jose CA, US
Yongsheng SHU - San Jose CA, US
Wei-chun FONG - Sunnyvale CA, US
Assignee:
ASML NETHERLANDS B.V. - Veldhoven
International Classification:
G03F 1/36
G06N 3/0464
G03F 7/20
Abstract:
A method for determining a mask pattern and a method for training a machine learning model. The method for determining a mask pattern includes obtaining, via executing a model using a target pattern to be printed on a substrate as an input pattern, a post optical proximity correction (post-OPC) pattern; determining, based on the post-OPC pattern, a simulated pattern that will be printed on the substrate; and determining the mask pattern based on a difference between the simulated pattern and the target pattern. The determining of the mask pattern includes modifying, based on the difference, the input pattern inputted to the model such that the difference is reduced; and executing, using the modified input pattern, the model to generate a modified post-OPC pattern from which the mask pattern can be derived.

Normalization Of Unstructured Catalog Data

View page
US Patent:
20200089800, Mar 19, 2020
Filed:
Sep 13, 2018
Appl. No.:
16/129996
Inventors:
- Walldorf, DE
Sudha Lakshman - Sunnyvale CA, US
Quan Zhang - San Jose CA, US
Sandeep Chakravarty - San Francisco CA, US
Tu Truong - San Jose CA, US
Fuming Wu - Palo Alto CA, US
Yue Li - Palo Alto CA, US
Lin Dong - Palo Alto CA, US
Richa Namballa - Palo Alto CA, US
International Classification:
G06F 17/30
G06F 17/21
Abstract:
Provided is a method and system for normalizing catalog item data to create higher quality search results. In one example, the method may include receiving a record comprising an unstructured description of an object, identifying a type of the object from among a plurality of object types and identifying a predefined attribute of the identified type of object, extracting a value from the unstructured description corresponding to the predefined attribute and modifying the extracted value to generate a normalized attribute value, and storing a structured record of the object in a structured format comprising a plurality of values of a plurality of attributes of the object from the unstructured description including the normalized attribute value for the predefined attribute of the object.

Assist Feature Placement Based On Machine Learning

View page
US Patent:
20200050099, Feb 13, 2020
Filed:
May 4, 2018
Appl. No.:
16/606791
Inventors:
- Veldhoven, NL
Yi ZOU - Foster City CA, US
Chenxi LIN - Newark CA, US
Yu CAO - Saratoga CA, US
Yen-Wen LU - Saratoga CA, US
Quan ZHANG - San Jose CA, US
Stanislas Hugo Louis BARON - San Jose CA, US
Ya LUO - Saratoga CA, US
Assignee:
ASML NETHERLANDS B.V. - Veldhoven
International Classification:
G03F 1/36
G06F 17/50
G06N 20/10
G05B 19/4097
G06K 9/46
G06T 7/60
G06T 7/00
Abstract:
A method including: obtaining a portion of a design layout; determining characteristics of assist features based on the portion or characteristics of the portion; and training a machine learning model using training data including a sample whose feature vector includes the characteristics of the portion and whose label includes the characteristics of the assist features. The machine learning model may be used to determine characteristics of assist features of any portion of a design layout, even if that portion is not part of the training data.

Hybrid And Hierarchical Outlier Detection System And Method For Large Scale Data Protection

View page
US Patent:
20190220339, Jul 18, 2019
Filed:
Mar 26, 2019
Appl. No.:
16/365471
Inventors:
- Armonk NY, US
Ramani R. Routray - San Jose CA, US
Quan Zhang - Detroit MI, US
International Classification:
G06F 11/07
G06N 7/00
G06K 9/62
G06F 17/10
G06F 17/18
G06F 11/14
G06N 3/00
G06K 9/00
Abstract:
One embodiment provides a method comprising receiving metadata comprising univariate time series data for each variable of a multivariate time series. The method comprises, for each variable of the multivariate time series, applying a hybrid and hierarchical model selection process to select an anomaly detection model suitable for the variable based on corresponding univariate time series data for the variable and covariations and interactions between the variable and at least one other variable of the multivariate time series, and detecting an anomaly on the variable utilizing the anomaly detection model selected for the variable. Based on each anomaly detection model selected for each variable of the multivariate time series, the method further comprises performing ensemble learning to determine whether the multivariate time series is anomalous at a particular time point.

Hybrid And Hierarchical Outlier Detection System And Method For Large Scale Data Protection

View page
US Patent:
20180189128, Jul 5, 2018
Filed:
Jan 3, 2017
Appl. No.:
15/397627
Inventors:
- Armonk NY, US
Ramani R. Routray - San Jose CA, US
Quan Zhang - Detroit MI, US
International Classification:
G06F 11/07
G06F 11/14
Abstract:
One embodiment provides a method comprising receiving metadata comprising univariate time series data for each variable of a multivariate time series. The method comprises, for each variable of the multivariate time series, applying a hybrid and hierarchical model selection process to select an anomaly detection model suitable for the variable based on corresponding univariate time series data for the variable and covariations and interactions between the variable and at least one other variable of the multivariate time series, and detecting an anomaly on the variable utilizing the anomaly detection model selected for the variable. Based on each anomaly detection model selected for each variable of the multivariate time series, the method further comprises performing ensemble learning to determine whether the multivariate time series is anomalous at a particular time point.
Control profile
Quan Y Zhang from Stillwater, OK, age ~72 Get Report