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Qing A Liu

from Cupertino, CA
Age ~56
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Also known as:
Anna Liu, Qing Lui
Phone and address:
20889 Hanford Dr, Cupertino, CA 95014
(408) 529-1103
Related to:
Liu Liu, 40Guo H Liu, 74Liang Liu, 54Baosheng Liu, 64Dexin LiuBaorong Liu, 51Xue Liu, 41Liang Zhang, 51
Connected to:
Adela Liu, 73Alec X Liu, 39Alpha T Liu, 46Amon Y Liu, 58Andrea Y Liu, 46Anqi Liu, 39Arden K Liu, 64Ba S Liu, 62Bailu Liu, 35Ban Liu, 48

Qing Liu Phones & Addresses

  • 20889 Hanford Dr, Cupertino, CA 95014 (408) 529-1103
  • Round Rock, TX
  • Santa Clara, CA
  • 1185 Malibu Dr, San Jose, CA 95129

Professional Records

License Records

Qing Mei Liu

License #:
PTC.021858 - Expired
Issued Date:
Sep 10, 2014
Expiration Date:
Mar 10, 2016
Type:
Pharmacy Technician Candidate

Qing An Liu

License #:
FMC03892 - Expired
Category:
Food Safety
Issued Date:
Apr 26, 1996
Expiration Date:
Jan 31, 1999
Type:
Certified Food Safety Mgr

Medicine Doctors

Qing Liu Photo 1

Qing Liu

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Specialties:
Internal Medicine
Work:
IPC Healthcare
111 Continental Dr STE 406, Newark, DE 19713
(302) 368-2630 (phone), (302) 368-1271 (fax)
Education:
Medical School
University of Illinois, Chicago College of Medicine
Graduated: 2000
Languages:
English
Description:
Dr. Liu graduated from the University of Illinois, Chicago College of Medicine in 2000. He works in Newark, DE and specializes in Internal Medicine. Dr. Liu is affiliated with Christiana Hospital, Saint Francis Healthcare and Wilmington Hospital.
Qing Liu Photo 2

Qing Liu

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Specialties:
Anesthesiology
Work:
East Manhattan Anesthesia Partners
310 E 14 St, New York, NY 10003
(212) 979-4464 (phone), (212) 614-8233 (fax)
Education:
Medical School
Cornell University Weill Medical College
Graduated: 2001
Languages:
Chinese
English
Russian
Spanish
Description:
Dr. Liu graduated from the Cornell University Weill Medical College in 2001. She works in New York, NY and specializes in Anesthesiology. Dr. Liu is affiliated with New York Eye & Ear Infirmary Of Mount Sinai.
Qing Liu Photo 3

Qing Yan Liu

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Qing Liu Photo 4

Qing Liu

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Specialties:
Internal Medicine
Hospitalist
Education:
Shanghai First Medical College (1988)

Resumes

Resumes

Qing Liu Photo 5

Qing Liu San Jose, CA

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Work:
Pachamama Alliance

2012 to 2013
Coordinator
Blue Star International Trade and Customs Company

2008 to 2010
Marketing Consultant
Education:
SAN FRANCISCO STATE UNIVERSITY
2011 to 2014
MBA in finance
TIANJIN FOREIGN STUDIES UNIVERSITY
2006 to 2010
International business

Business Records

Name / Title
Company / Classification
Phones & Addresses
Qing Liu
Studykit LLC
726 Oak Grv Ave, Menlo Park, CA 94025
Qing Liu
OHIO CENTER FOR EAST-WEST CULTURAL EXCHANGE

Publications

Isbn (Books And Publications)

Algebraic Geometry and Arithmetic Curves

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Author

Qing Liu

ISBN #

0198502842

Algebraic Geometry And Arithmetic Curves

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Author

Qing Liu

ISBN #

0199202494

Rough Sets, Fuzzy Sets, Data Mining, and Granular Computing: 9th International Conference, Rsfdgrc 2003, Chongqing, China, May 26-29, 2003 Proceedings

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Author

Qing Liu

ISBN #

3540140409

Us Patents

Methods For Characterizing Dielectric Properties Of Parts

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US Patent:
7777500, Aug 17, 2010
Filed:
Sep 29, 2008
Appl. No.:
12/240414
Inventors:
Jaehyun Kim - Fremont CA, US
Arthur H. Sato - San Jose CA, US
Keith Comendant - Fremont CA, US
Qing Liu - Austin TX, US
Feiyang Wu - San Francisco CA, US
Assignee:
Lam Research Corporation - Fremont CA
International Classification:
G01R 27/26
US Classification:
324663, 324639
Abstract:
Characterizing dielectric properties of a part includes placing a full-sized part within a dielectric property measurement apparatus. In one embodiment, the full-sized part is a dielectric part of a plasma processing system. The dielectric property measurement apparatus is operated to determine a dielectric constant value of the full-sized part and a loss tangent value of the full-sized part. The determined dielectric constant and loss tangent values are affixed to the full-sized part.

Methods For Measuring Dielectric Properties Of Parts

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US Patent:
7911213, Mar 22, 2011
Filed:
Sep 29, 2008
Appl. No.:
12/240375
Inventors:
Jaehyun Kim - Fremont CA, US
Arthur H. Sato - San Jose CA, US
Keith Comendant - Fremont CA, US
Qing Liu - Austin TX, US
Feiyang Wu - San Francisco CA, US
Assignee:
Lam Research Corporation - Fremont CA
International Classification:
G01R 27/26
US Classification:
324671, 324663
Abstract:
A method is disclosed for calibrating a capacitance of an apparatus for measuring dielectric properties of a part. The apparatus includes an electrically grounded chamber, a lower electrode disposed within the chamber and connected to a radiofrequency (RF) transmission rod, an electrically grounded upper electrode disposed within the chamber above the lower electrode, and a variable capacitor connected to control transmission of RF power through the RF transmission rod to the lower electrode. A method is also disclosed for determining a capacitance of a part through use of the apparatus. A method is also disclosed for determining a dielectric constant of a part through use of the apparatus. A method is also disclosed for determining a loss tangent of a part through use of the apparatus.

Methods For Measuring Dielectric Properties Of Parts

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US Patent:
7973539, Jul 5, 2011
Filed:
Feb 17, 2011
Appl. No.:
13/030015
Inventors:
Jaehyun Kim - Fremont CA, US
Arthur H. Sato - San Jose CA, US
Keith Comendant - Fremont CA, US
Qing Liu - Austin TX, US
Feiyang Wu - San Francisco CA, US
Assignee:
Lam Research Corporation - Fremont CA
International Classification:
G01R 35/00
G01R 31/00
US Classification:
324601, 32475002
Abstract:
A method is disclosed for calibrating a capacitance of an apparatus for measuring dielectric properties of a part. The apparatus includes an electrically grounded chamber, a lower electrode disposed within the chamber and connected to a radiofrequency (RF) transmission rod, an electrically grounded upper electrode disposed within the chamber above the lower electrode, and a variable capacitor connected to control transmission of RF power through the RF transmission rod to the lower electrode. A method is also disclosed for determining a capacitance of a part through use of the apparatus. A method is also disclosed for determining a dielectric constant of a part through use of the apparatus. A method is also disclosed for determining a loss tangent of a part through use of the apparatus.

Apparatus For Measuring Dielectric Properties Of Parts

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US Patent:
8269510, Sep 18, 2012
Filed:
Sep 29, 2008
Appl. No.:
12/240291
Inventors:
Jaehyun Kim - Fremont CA, US
Arthur H. Sato - San Jose CA, US
Keith Comendant - Fremont CA, US
Qing Liu - Austin TX, US
Feiyang Wu - San Francisco CA, US
Assignee:
Lam Research Corporation - Fremont CA
International Classification:
G01R 27/26
US Classification:
324671, 324663
Abstract:
A chamber formed from an electrically conductive material is connected to a ground potential. A hot electrode formed from an electrically conductive material is disposed within the chamber in a substantially horizontal orientation and is physically separated from the chamber. The hot electrode includes a top surface defined to support a part to be measured. A radiofrequency (RF) transmission rod is connected to extend from a bottom surface of the hot electrode through an opening in a bottom of the chamber and be physically separated from the chamber. The RF transmission rod is defined to transmit RF power from a conductor plate in an electrical components housing to the hot electrode. An upper electrode formed from an electrically conductive material is disposed within the chamber in a substantially horizontal orientation. The upper electrode is electrically connected to the chamber and is defined to be movable in a vertical direction.

Electrode For Use In Measuring Dielectric Properties Of Parts

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US Patent:
8519724, Aug 27, 2013
Filed:
Sep 29, 2008
Appl. No.:
12/240329
Inventors:
Jaehyun Kim - Fremont CA, US
Arthur H. Sato - San Jose CA, US
Keith Comendant - Fremont CA, US
Qing Liu - Austin TX, US
Feiyang Wu - San Francisco CA, US
Assignee:
Lam Research Corporation - Fremont CA
International Classification:
G01R 27/26
US Classification:
324663, 324637, 324639, 324601, 15634529, 15634547, 438 17
Abstract:
A plate of substantially uniform thickness is formed from an electrically conductive material. The plate has a top surface defined to support a part to be measured. The plate has a bottom surface defined to be connected to a radiofrequency (RF) transmission rod such that RF power can be transmitted through the RF transmission rod to the plate. The plate is defined to have a number of holes cut vertically through the plate at a corresponding number of locations that underlie embedded conductive material items in the part to be measured when the part is positioned on the top surface of the plate.

Electrode For Use In Measuring Dielectric Properties Of Parts

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US Patent:
20130241581, Sep 19, 2013
Filed:
Apr 22, 2013
Appl. No.:
13/867961
Inventors:
Arthur H. Sato - San Jose CA, US
Keith Comendant - Fremont CA, US
Qing Liu - Austin TX, US
Feiyang Wu - San Francisco CA, US
Assignee:
Lam Research Corporation - Fremont CA
International Classification:
G01N 27/04
US Classification:
324693
Abstract:
A plate of substantially uniform thickness is formed from an electrically conductive material. The plate has a top surface defined to support a part to be measured. The plate has a bottom surface defined to be connected to a radiofrequency (RF) transmission rod such that RF power can be transmitted through the RF transmission rod to the plate. The plate is defined to have a number of holes cut vertically through the plate at a corresponding number of locations that underlie embedded conductive material items in the part to be measured when the part is positioned on the top surface of the plate.

Wireless Pairing And Communication Between Devices Using Biometric Data

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US Patent:
20140068725, Mar 6, 2014
Filed:
Aug 31, 2012
Appl. No.:
13/601829
Inventors:
Chang Zhang - San Jose CA, US
Qing Liu - Mountain View CA, US
Assignee:
Apple Inc. - Cupertino CA
International Classification:
G06F 21/00
US Classification:
726 5
Abstract:
In a first implementation, a host determines to pair with a device and transmits biometric data for a user to the device. The device receives the transmitted biometric data and compares such to device biometric data to determine whether or not to pair with the host and/or what data stored by the device to allow the host to access. The host then accesses data of the device to which the device has allowed access. In another implementation, a device determines to pair with a host and transmits biometric data for a user to the host. The host receives the transmitted biometric data and compares such to device biometric data to determine whether or not to pair with the device and/or what data stored by the host to allow the device to access. The device then accesses data of the host to which the host has allowed access.

Battery Charging With Reused Inductor For Boost

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US Patent:
20180102664, Apr 12, 2018
Filed:
Dec 6, 2017
Appl. No.:
15/833577
Inventors:
- Cupertino CA, US
Qing Liu - Cupertino CA, US
William C. Athas - Cupertino CA, US
International Classification:
H02J 7/00
H02M 3/158
G06F 1/26
Abstract:
The disclosed embodiments provide a system that manages use of a battery in a portable electronic device. During operation, the system provides a charging circuit for converting an input voltage from a power source into a set of output voltages for charging the battery and powering a low-voltage subsystem and a high-voltage subsystem in the portable electronic device. Upon detecting discharging of the battery in a low-voltage state, the system uses the charging circuit to directly power the low-voltage subsystem from a battery voltage of the battery and up-convert the battery voltage to power the high-voltage subsystem.
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Qing A Liu from Cupertino, CA, age ~56 Get Report