Li Fan

6934256, Aug 23, 2005

Jan 25, 2001

09/769544

Van Jacobson - Woodside CA, US
Li Fan - San Jose CA, US
Kathleen Nichols - Woodside CA, US

Cisco Technology, Inc. - San Jose CA

H04L012/26

370235, 3702351

A network device identifies a non-adaptive flow as follows. The network device drops packets on a random basis using a Random Early Detection (RED) algorithm. A classifier reads indicia of a selected flow from at least one field of a header of a packet received by the network device. The network device calculates a drop interval for packets of the selected flow dropped by the RED algorithm, in response to a time at which the packets were dropped. The network device then applies a statistical test to drop intervals of a plurality of flows in order to identify the non-adaptive flow.

7782072, Aug 24, 2010

Sep 27, 2006

11/535859

Li Fan - San Ramon CA, US
John K. Gritters - Livermore CA, US

FormFactor, Inc. - Livermore CA

G01R 31/02

324762

A probe group can include multiple probes for testing devices having contact pads. The probes can comprise beams, contact tip structures, and mounting portions. The beams can provide for controlled deflection of the probes. The contact tip structures can be connected to the beams and can include contact portions for contacting with the devices. The mounting portions of the beams can be attached to support structures, which can be arranged in a staggered pattern. The beams located in a first row of the staggered pattern can include narrowing regions that lie substantially in line with the mounting portions of a second row of the beams.

7948876, May 24, 2011

Jun 7, 2005

11/146585

Van Jacobson - Woodside CA, US
Li Fan - San Jose CA, US
Kathleen Nichols - Woodside CA, US

Cisco Technology, Inc. - San Jose CA

G01R 31/08

370229, 370252, 370235, 370392, 370469

A network device identifies a non-adaptive flow as follows. The network device drops packets on a random basis using a Random Early Detection (RED) algorithm. A classifier reads indicia of a flow from at least one field of a header of a packet received by the network device. The network device calculates a drop interval for packets of the flow dropped by the RED algorithm, in response to a time at which the packets were dropped. The network device then applies a statistical test to drop intervals of a plurality of flows in order to identify the non-adaptive flow.

8148646, Apr 3, 2012

Sep 29, 2008

12/240505

Li Fan - San Ramon CA, US
Michael J. Armstrong - Danville CA, US
John K. Gritters - Livermore CA, US

FormFactor, Inc. - Livermore CA

H05K 1/11

174261, 361760, 439 66, 32475403

A contact apparatus can be made by providing a first substrate with electrically conductive terminals and second substrates each of which can have contact structures. Each of the contact structures can have a contact tip. The second substrates can be aligned such that contact tips of the contact structures are aligned substantially in a plane. An optical system can be used to monitor an actual position of the second substrates, and a mechanical system can be used to move the second substrates to aligned positions. The contact structures can be attached to ones of the terminals on the first substrate while the second substrates are in the aligned positions.

8203352, Jun 19, 2012

Aug 24, 2010

12/861984

Li Fan - San Ramon CA, US
John K. Gritters - Livermore CA, US

FormFactor, Inc. - Livermore CA

G01R 31/00
G01R 1/067

32475401, 32475507

A probe group can include multiple probes for testing devices having contact pads. The probes can comprise beams, contact tip structures, and mounting portions. The beams can provide for controlled deflection of the probes. The contact tip structures can be connected to the beams and can include contact portions for contacting with the devices. The mounting portions of the beams can be attached to support structures, which can be arranged in a staggered pattern. The beams located in a first row of the staggered pattern can include narrowing regions that lie substantially in line with the mounting portions of a second row of the beams.

20100140793, Jun 10, 2010

May 22, 2009

12/470971

Li Fan - San Ramon CA, US
John K. Gritters - Livermore CA, US

FORMFACTOR, INC. - Livermore CA

H01L 23/48
C23F 1/00

257734, 216 18, 216 11, 257E2301

A process for making contact elements for a probe card assembly includes steps of forming a first continuous trench in a substrate along a first direction, and forming simultaneously a plurality of tip structures adjacent one to another in the first continuous trench in a second direction substantially normal to the first direction, each of the tip structures being part of, or adapted to be part of at least one corresponding contact element capable of forming an electrical contact with a terminal of an electronic device.

20230052819, Feb 16, 2023

Oct 25, 2022

17/973166

- San Francisco CA, US
Li Fan - Belmont CA, US
Trunal Bhanse - Sunnyvale CA, US
Andrew Chen - San Francisco CA, US

G06Q 10/02
G06Q 30/02
H04W 4/02
G06Q 30/06
G06N 20/00

Systems and methods are provided for receiving a request for services in a given location from a client device operated by a user and generating a set of features based on information included in the request for services in the given location. The systems and methods further provide for analyzing the set of features using a machine learning model to predict whether only services that can be instantly booked should be provided in response to the request for services in the given location, analyzing a prediction output by the machine learning model to determine that only services that can be instantly booked should be provided in response to the request for services in the given location, and generating a list with only services that can be instantly booked.