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Ken Ye Phones & Addresses

  • Sunnyvale, CA
  • 2547 Riparian Ct, San Jose, CA 95133 (510) 847-0472
  • Newark, CA
  • 4833 Montague Ave, Fremont, CA 94555 (510) 790-9368
  • 3750 Tamayo St, Fremont, CA 94536 (510) 793-7936
  • Palm Bay, FL
  • San Lorenzo, CA
  • Berkeley, CA
  • Dublin, CA

Professional Records

Medicine Doctors

Ken Ye Photo 1

Ken Ye

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Specialties:
Internal Medicine
Work:
Westshore Internal Medicine
1150 E Sherman Blvd STE 1100, Muskegon, MI 49444
(231) 672-2203 (phone), (231) 672-2992 (fax)
Education:
Medical School
Sun Yat Sen Univ of Med Sci, Guangzhou, China (242 21 Pr 1/71)
Graduated: 1987
Procedures:
Bone Marrow Biopsy
Wound Care
Arthrocentesis
Cardiac Stress Test
Destruction of Benign/Premalignant Skin Lesions
Electrocardiogram (EKG or ECG)
Pulmonary Function Tests
Skin Tags Removal
Vaccine Administration
Conditions:
Abdominal Hernia
Acute Upper Respiratory Tract Infections
Alopecia Areata
Alzheimer's Disease
Aortic Valvular Disease
Languages:
English
Spanish
Description:
Dr. Ye graduated from the Sun Yat Sen Univ of Med Sci, Guangzhou, China (242 21 Pr 1/71) in 1987. He works in Muskegon, MI and specializes in Internal Medicine. Dr. Ye is affiliated with Mercy Health Muskegon.

Resumes

Resumes

Ken Ye Photo 2

Principal And Technologist Engineer

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Location:
35806 Cedar Blvd, Newark, CA 94560
Industry:
Semiconductors
Work:
Microchip Technology Aug 2016 - Dec 2017
Hardware Engineer Manager

Sandisk Aug 2016 - Dec 2017
Principal and Technologist Engineer

Dorabot Inc. Apr 2016 - Aug 2016
Embedded System Engineer

Atmel Corporation Mar 1, 2010 - Apr 2016
Staff Design Engineer

Atmel Corporation 2004 - 2010
Senior Circuit Design Engineer
Education:
University of California, Santa Cruz 2013
Santa Clara University 2005 - 2007
Master of Science, Masters, Leadership, Management, Engineering
University of California, Berkeley 1998 - 2001
Bachelors, Bachelor of Science, Electrical Engineering, Electrical Engineering and Computer Science, Computer Science
Skills:
Semiconductors
Asic
Rtl Design
Mixed Signal
Verilog
Circuit Design
Systemverilog
Embedded Systems
Flash Memory
Integrated Circuit Design
Analog
Cadence Virtuoso
Field Programmable Gate Arrays
Uvm
Embedded Linux
C++
Cmos
Silicon
Real Time System Design
Interests:
Programming
Robotics
Java
See 1
Badminton
See Less
Machine Learning
New Technologies
Photography
Ping Pong
Transformers
Tennis
Languages:
English
Mandarin
Cantonese
Certifications:
Embedded System Certificate
Ken Ye Photo 3

Ken Ye

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Ken Ye Photo 4

Ken Ye

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Business Records

Name / Title
Company / Classification
Phones & Addresses
Ken Ye
Guiding Star Group
Business Consulting Services · Nonclassifiable Establishments · Asset Management · Business Services
1900 S Norfolk St, San Mateo, CA 94403
1485 Enea Cir, Concord, CA 94520
1840 Gtwy Dr, San Mateo, CA 94404
1485 Civic Ct STE 1470, Concord, CA 94520
(925) 692-5889

Publications

Us Patents

Signal Integrity Checking Circuit

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US Patent:
6856557, Feb 15, 2005
Filed:
May 30, 2003
Appl. No.:
10/452562
Inventors:
Johnny Chan - Fremont CA, US
Jinshu Son - Saratoga CA, US
Ken Kun Ye - Fremont CA, US
Tinwai Wong - Fremont CA, US
Assignee:
Atmel Corporation - San Jose CA
International Classification:
G11C011/34
US Classification:
365190, 365233
Abstract:
A signal integrity checking circuit for an integrated circuit detects whether signal condition involving loading of data into storage elements is valid or improper and flags the result. The integrity circuit includes a plurality of adjacently positioned and substantially similar storage elements, which are clocked by a common clock line and loaded from a common data input line. A common reset line may also be provided. The storage elements may be flip-flops, latches, RAM, etc. A logic gate, such as a NAND gate, receives the storage element outputs and flags improper loading of data. Inverters on the input and output sides of one storage element force it to the opposite state from the other storage element. The signal integrity checking circuit is valuable for ensuring proper loading during power-on or start-up, and at other times when loading of data may occur.

Charge Pump For Intermediate Voltage

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US Patent:
7279961, Oct 9, 2007
Filed:
Nov 21, 2005
Appl. No.:
11/284780
Inventors:
Johnny Chan - Fremont CA, US
Tin Wai Wong - Fremont CA, US
Ken Kun Ye - Fremont CA, US
Assignee:
Atmel Corporation - San Jose CA
International Classification:
G05F 1/10
G05F 3/02
US Classification:
327540, 327536, 363 60
Abstract:
A charge pump generates a voltage higher than an intermediate voltage and a regulator circuit provides a first regulated voltage higher than the intermediate voltage. A second stage includes a regulator stage using the first voltage to provide the intermediate voltage from the first voltage. A charge pump provides a pump output voltage. The pump output voltage is divided and the divided voltage is presented to a first comparator that compares it with a reference voltage. The first comparator drives the gate of a first MOS transistor to regulate the pump output voltage to a regulated voltage related to the reference voltage. The regulated voltage is presented to a second comparator that compares it with the reference voltage. The second comparator drives the gate of a second MOS transistor to downconvert the regulated output voltage to an intermediate voltage related to the reference voltage.

Device And Method Of Supplying Power To Targets On Single-Wire Interface

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US Patent:
7782240, Aug 24, 2010
Filed:
May 29, 2007
Appl. No.:
11/754879
Inventors:
Philip S. Ng - Cupertino CA, US
Ken Ye - Fremont CA, US
Assignee:
Atmel Corporation - San Jose CA
International Classification:
H03M 1/12
US Classification:
341155, 370447
Abstract:
A single-wire interface communication system is capable of providing both electrical communication of signals and power between devices coupled to the system. Coupled to the single-wire interface is at least one target device which contains a PMOS transistor, a charge storage device, an inverter controlling the PMOS transistor, and a target device function. The charge storage device provides power to the target device function and to the inverter. The PMOS transistor receives power from the single-wire interface at a power-supply voltage level and charges the charge storage device to the same level. Non-communication periods produce a charging period sufficient for the charge storage device to attain the power-supply voltage level.

Circuit For Testing And Fine Tuning Integrated Circuit (Switch Control Circuit)

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US Patent:
6815992, Nov 9, 2004
Filed:
Jun 25, 2003
Appl. No.:
10/607286
Inventors:
Philip S. Ng - Cupertino CA
Ken Kun Ye - Fremont CA
Jinshu Son - Saratoga CA
Assignee:
Atmel Corporation - San Jose CA
International Classification:
H03K 3037
US Classification:
327199, 327407
Abstract:
A switch controlling circuit for the testing and fine-tuning of integrated circuits comprising of a series of flip-flops chain together in a serial manner. The contents of the flip-flop are shift in from the input of the first flip-flop in the chain. The output of each flip-flop connects to individual switch whereby the states of the flip-flops control the state of the switches.
Ken K Ye from Sunnyvale, CA Get Report