Jack Lau Phones & Addresses
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45393 Willowick St, Temecula, CA 92592
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3 African Violets Pl, Spring, TX 77382
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The Woodlands, TX
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Palm Desert, CA
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Las Vegas, NV
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4343 Pickerel Dr, Union City, CA 94587 (510) 441-1686
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2665 Morello Ct, Union City, CA 94587
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Milpitas, CA
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Riverside, CA
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Alameda, CA
Business Records
Name / Title
Company / Classification
Phones & Addresses
MM
COLOSSIAN TRADING LTD CO
2800 Post Oak Blvd STE 5800, Houston, TX 77056
Publications
Us Patents
Pin Driver For In-Circuit Test Apparatus
View pageUS Patent:
51461595, Sep 8, 1992
Filed:
Feb 1, 1991
Appl. No.:
7/649081
Inventors:
Jack Lau - San Francisco CA
Armagan A. Akar - San Jose CA
Hung-Wah A. Lau - Los Altos CA
Armagan A. Akar - San Jose CA
Hung-Wah A. Lau - Los Altos CA
Assignee:
Schlumberger Technologies, Inc. - San Jose CA
International Classification:
G01R 3128
H03F 326
H03F 326
US Classification:
324158R
Abstract:
A tri-state pin driver is formed in part, along with a pin sensor, on an integrated circuit. A pin driver and sensor are coupled to a common pin of a device under test. In normal mode, the pin driver drives a test signal. In high impedance mode, the pin driver is at a high impedance, enabling a sensor to monitor a response signal. The pin driver includes a driver stage formed off-chip by a pair of power transistors operated in the active region. The large power transistors enable a large current (i. e. , +/-500 mA) to be sourced or sunk so as to drive a device under test and back-drive preceding circuits. Operating in the active region enables faster logic state transition times, and thus, a fast test rate, while reducing undesirable signal distortion. A predriver stage is configured as a unity-gain emitter follower. The predriver stage includes first and second signal paths.