Hai Van Tran

6588070, Jul 8, 2003

Nov 8, 2001

09/986308

Hai Tran - Livermore CA, 94550

F16L 3304

24279

A low profile pipe leak repair clamp for sealing a leak in a wide range of pipe sizes includes a flexible, circular metal band lined with a sealing gasket. The clamp a tightening assembly comprising a pair of open and close lugs and a nut and bolt for tightening the band around a leaking pipe. Each lug includes an open slot leading to an inner recess adapted to firmly engage a folded end of the flexible metal band, the recess being of such dimensions as to maintain each folded end in its original shape, thus preventing the metal band from being pulled from the slot upon tightening the clamp. Each lug has an upper jaw and a lower pressure jaw forming the slot and recess. The lower pressure jaw is arcuate at its end and its lower surface chamfered downward to the lower lug surface.

6637076, Oct 28, 2003

Jan 22, 2002

10/051071

Hai Tran - Livermore CA, 94550

F16L 1700

24279, 138 99

A fabricated steel pipe repair clamp having a steel band and interlocking steel lugs having respective tension bars and tightening bolts or studs forming the tightening assembly. The tightening assembly comprises a welded stud lug assembly, and a tension bar lug welded assembly, each having a base plate, and a backup plate. The two folded terminals of the clamping metal band are welded between the base plate and the backup plate forming the respective lug bodies. The laminated weld forming the lug assembly results in a stronger lug body backup plate and provides an even clamping force. An alternative embodiment combines the base plate and the backup plate connected to form jaws. Another embodiment employs an offset backup plate to form the lugs to receive the band ends in a recess formed between the tensioner bars and between the studs shank portions.

7468611, Dec 23, 2008

Oct 19, 2007

11/875655

Kent Nguyen - San Jose CA, US
Eric Thompson - San Jose CA, US
Hai Tran - San Jose CA, US
Kaushal Gangakhedkar - San Jose CA, US
Robert Barnett - San Jose CA, US
Daniel Toet - Santa Clara CA, US
David Baldwin - Atascadero CA, US
Steve Aochi - Morgan Hill CA, US
Neil Nguyen - Milpitas CA, US

Photon Dynamics, Inc. - San Jose CA

G01R 31/00
G01R 31/02

324754, 324770, 3241581

A system performs continuous full linear scan of a flat media. The system includes, in part, a chuck, and at least first, second and third gantries. The chuck is adapted to support the flat media during the test. The first gantry includes at least one linear array of non-contacting sensors that spans the width of the flat media and is adapted to move across an entire length of the flat media. Each of the second and third gantries includes a probe head that spans the width of the flat media and each is adapted to apply an electrical signal to the flat media. Each probe head is further adapted to move along a direction substantially perpendicular to the surface of the flat media during the times when the first gantry is in motion and while test signals are being continuously applied.

20120319713, Dec 20, 2012

Jan 7, 2011

13/521034

Kent Nguyen - San Jose CA, US
Kaushal Gangakhedkar - San Jose CA, US
David Baldwin - Atascadero CA, US
Nile Light - Livermore CA, US
Steve Aochi - Morgan Hill CA, US
Yan Wang - Sunnyvale CA, US
Atila Ersahin - Fremont CA, US
Hai Tran - San Jose CA, US
Thomas H. Bailey - San Jose CA, US
Kiran Jitendra - San Jose CA, US
Alan Cable - San Jose CA, US
Dave Smiley - San Jose CA, US
Thomas E. Wishard - Santa Cruz CA, US

PHOTON DYNAMICS, INC. - San Jose CA

G01R 31/20
G01K 1/00
G01J 1/00

32475403, 356213, 374100, 374E01001

A probe system for facilitating the inspection of a device under test. System incorporates a storage rack; a probe bar gantry assembly; a probe assembly configured to electrically mate the device under test; and a robot system for picking the probe assembly from the storage rack and deliver the probe assembly to the probe bar gantry. The robot system is also enabled to pick a probe assembly from the probe bar gantry and deliver the probe assembly to the storage rack. The probe assembly includes a clamping assembly for attaching the probe assembly to the probe bar gantry or the storage rack. The probe assembly may include an array of contact pins configured to mate with conductive pads on the device under test when the probe assembly is installed on the probe bar gantry assembly.