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Fei A Peng

from Los Gatos, CA
Age ~54
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Also known as:
Fei S Peng, Peng Fei, Peng Fie
Related to:
Eric P Avila, 53Szu Y Liang, 56Russell Avilla, 39Fred A RussellLiane Avila, 75
Connected to:
Andrew Peng, 67Benny Peng, 73Bing L Peng, 53Bo Peng, 57Chou M Peng, 86Chung Peng, 60De H Peng, 58Douglas T Peng, 64Eliot S Peng, 37Gordon J Peng, 32

Fei Peng Phones & Addresses

  • Los Gatos, CA
  • Castro Valley, CA
  • San Jose, CA
  • Saratoga, CA
  • Foster City, CA
  • Cassel, CA
  • Fremont, CA
  • Santa Clara, CA
  • 22482 Princeton Pl, Castro Valley, CA 94552

Work

Position: Clerical/White Collar

Education

Degree: High school graduate or higher

Resumes

Resumes

Fei Peng Photo 1

Fei Peng

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Work:
Philosys Software Gmbh Apr 2012 - Jan 2014
Software Engineer
Education:
Hochschule Augsburg 2010 - 2012
Masters
Interests:
Scientific Research
Cooking
Sport
Tcm (Traditional Chinese Medicine)
Reading
Fitness
Music
Languages:
German
English
Fei Peng Photo 2

Visiting Phd Student

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Work:

Visiting Phd Student
Fei Peng Photo 3

Fei Peng

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Fei Peng Photo 4

Fei Peng

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Fei Peng Photo 5

Fei Peng

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Location:
United States
Fei Peng Photo 6

Fei Peng

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Location:
United States
Fei Peng Photo 7

Fei Peng

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Location:
San Francisco Bay Area
Industry:
Electrical/Electronic Manufacturing
Fei Peng Photo 8

Gm, Lubricants, Asia Pacific At Chevron

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Location:
United States
Industry:
Oil & Energy

Business Records

Name / Title
Company / Classification
Phones & Addresses
Fei Peng
President
Bravura International Corporation
Business Services at Non-Commercial Site
20994 Sherman Dr, Hayward, CA 94552

Publications

Isbn (Books And Publications)

Approche Spatio-Temporelle De La Mortalite: Cas De La Chine Dans Les Annees 1980 = Chung-Kuo 1982 Ho 1990 Nien Jen Kou Pu Cha Fen Sheng Sheng Ming Piao Ti Kou Tsao Chi Chi Cha I Ti Tung Tai Fen Hsi

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Author

Fei Peng

ISBN #

2738439977

Approche Spatio-Temporelle De La Mortalite: Cas De La Chine Dans Les Annees 1980 = Chung-Kuo 1982 Ho 1990 Nien Jen Kou Pu Cha Fen Sheng Sheng Ming Piao Ti Kou Tsao Chi Chi Cha I Ti Tung Tai Fen Hsi

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Author

Fei Peng

ISBN #

2872094814

Us Patents

Dynamic Image Analysis And Cropping

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US Patent:
20230020233, Jan 19, 2023
Filed:
Sep 16, 2022
Appl. No.:
17/946720
Inventors:
- Cupertino CA, US
Fei Peng - San Jose CA, US
Wenyu Zhang - San Jose CA, US
Matthew H. Thorn - Seattle WA, US
Sean Michael Harold - San Jose CA, US
Douglas Isaac Friedman - San Francisco CA, US
Leticia Marie Alarcón - San Jose CA, US
International Classification:
G06V 20/20
G06T 7/11
G06V 40/16
Abstract:
The disclosed techniques generally relate to devices and methods for generating cropped images in which one or more features of interest are preserved or emphasized. In one implementation, such features of interest may include facial features. In accordance with certain implementations, location and extent of such features may be identified and used in conjunction with information regarding display characteristics so as to generate cropped images preserving or emphasizing the feature of interest when displayed on a given device.

Shadow Mask With Plasma Resistant Coating

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US Patent:
20210222291, Jul 22, 2021
Filed:
May 24, 2016
Appl. No.:
16/096665
Inventors:
- Santa Clara CA, US
Fei PENG - San Jose CA, US
Kiran KRISHNAPUR - Milpitas CA, US
Ruiping WANG - San Jose CA, US
Jrjyan Jerry CHEN - Campbell CA, US
Steven VERHAVERBEKE - San Francisco CA, US
Robert Jan VISSER - Menlo Park CA, US
International Classification:
C23C 16/04
C23C 16/44
H01L 51/52
H01L 51/56
Abstract:
A mask assembly () includes a mask frame () and a mask screen (), both of the mask frame () and the mask screen () made of a metallic material, and a metal coating () disposed on exposed surfaces of one or both of the mask frame () and the mask screen ().

Dynamic Image Analysis And Cropping

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US Patent:
20190370546, Dec 5, 2019
Filed:
May 23, 2019
Appl. No.:
16/421146
Inventors:
- Cupertino CA, US
Fei Peng - San Jose CA, US
Wenyu Zhang - San Jose CA, US
Matthew H. Thorn - Seattle WA, US
Sean Michael Harold - San Jose CA, US
Douglas Isaac Friedman - San Francisco CA, US
Leticia Marie Alarcón - San Jose CA, US
International Classification:
G06K 9/00
G06T 7/11
Abstract:
The disclosed techniques generally relate to devices and methods for generating cropped images in which one or more features of interest are preserved or emphasized. In one implementation, such features of interest may include facial features. In accordance with certain implementations, location and extent of such features may be identified and used in conjunction with information regarding display characteristics so as to generate cropped images preserving or emphasizing the feature of interest when displayed on a given device.

Determining The Similarity Of Binary Executables

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US Patent:
20190005242, Jan 3, 2019
Filed:
Aug 14, 2017
Appl. No.:
15/676329
Inventors:
- Cupertino CA, US
Fei Peng - Santa Clara CA, US
Zhui Deng - Cupertino CA, US
International Classification:
G06F 21/56
Abstract:
In some implementations, a computing device can determine the similarity of binary executables. For example, the computing device can receive an application, including a binary executable. The computing device can generate function signatures for the functions called within the binary executable. The computing device can generate a locality sensitive hash value for the application based on the function signatures. The computing device can group applications based on the locality sensitive hash value generated for each application. The computing device can compare the function signatures of the binary executables of the applications within a group to determine the similarity of the applications. If two applications have binary executables that are over a threshold percentage of similarity, the two applications can be identified as clones of each other.

Methods And Apparatus For Processing Chamber Cleaning End Point Detection

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US Patent:
20180082827, Mar 22, 2018
Filed:
Sep 22, 2016
Appl. No.:
15/273631
Inventors:
- Santa Clara CA, US
Su Ho Cho - Santa Clara CA, US
Beomsoo Park - San Jose CA, US
Fei Peng - San Jose CA, US
Soo Young Choi - Fremont CA, US
International Classification:
H01J 37/32
G01N 21/73
C23C 16/50
C23C 16/455
Abstract:
Embodiments provide systems, methods and apparatus for detecting a cleaning endpoint of a cleaning process performed within a processing chamber. Embodiments include a spectrometer adapted to measure a spectrum response over time of a cleaning reaction within a processing chamber during a cleaning process; and a lens system coupled to the spectrometer and disposed to focus on a selected area within the processing chamber via a viewport and to amplify intensity of radiation from the selected area during the cleaning process. The selected area is chosen based on being the expected location of the last cleaning reaction during the cleaning process within the processing chamber (e.g., a corner in a rectangular chamber). Numerous other aspects are provided.

Endpoint Detection For A Chamber Cleaning Process

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US Patent:
20180057935, Mar 1, 2018
Filed:
Aug 23, 2017
Appl. No.:
15/684677
Inventors:
- Santa Clara CA, US
Beom Soo PARK - San Jose CA, US
Soo Young CHOI - Fremont CA, US
Fei PENG - San Jose CA, US
Todd EGAN - Fremont CA, US
International Classification:
C23C 16/44
B08B 9/08
B08B 7/00
B08B 9/46
G01N 21/94
H01J 37/32
Abstract:
Embodiments of the present invention provide an apparatus and methods for detecting an endpoint for a cleaning process. In one example, a method of determining a cleaning endpoint includes performing a cleaning process in a plasma processing chamber, directing an optical signal to a surface of a shadow frame during the cleaning process, collecting a return reflected optical signal reflected from the surface of the shadow frame, determining a change of reflectance intensity of the return reflected optical signal as collected, and determining an endpoint of the cleaning process based on the change of the reflected intensity. In another example, an apparatus for performing a plasma process and a cleaning process after the plasma process includes an optical monitoring system coupled to a processing chamber, the optical monitoring system configured to direct an optical beam light to a surface of a shadow frame disposed in the processing chamber.

Method For Testing A Low Power Radio Frequency (Rf) Data Packet Signal Transceiver

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US Patent:
20170078030, Mar 16, 2017
Filed:
Sep 14, 2015
Appl. No.:
14/852803
Inventors:
- SUNNYVALE CA, US
Ruizu Wang - San Ramon CA, US
Ke Liu - San Jose CA, US
Fei Peng - Fremont CA, US
International Classification:
H04B 17/17
H04W 24/06
Abstract:
Method for testing a radio frequency (RF) data packet signal transceiver device under test (DUT) including communicating via at least one of multiple available signal channels. Data packets exchanged between a tester and DUT as a normal part of a communication link initiation sequence are selectively exchanged and suppressed to enable testing of the DUT without requiring inclusion of special drivers within the DUT, special test software within the tester or establishment of a synchronized communication link between the tester and DUT. For example, in the case of a Bluetooth low energy transceiver, advertisement, scan request and scan response data packets can be used in such manner.
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Fei A Peng from Los Gatos, CA, age ~54 Get Report