Dae H Kim

D482908, Dec 2, 2003

Oct 9, 2002

29/168797

Dae Jin Kim - Bayside NY

Kiss Products, Inc. - Port Washington NY

0604

D 6475

D491312, Jun 8, 2004

Oct 9, 2002

29/168798

Dae Jin Kim - Bayside NY

Kiss Products, Inc. - Port Washington NY

2803

D28 61, D7624

D493256, Jul 20, 2004

Oct 9, 2002

29/168799

Dae Jin Kim - Bayside NY

Kiss Products, Inc. - Port Washington NY

2803

D28 61, D24230, D75543

7418368, Aug 26, 2008

Jan 18, 2007

11/624329

Dae Ik Kim - Fishkill NY, US
Jonghae Kim - Fishkill NY, US
Moon J Kim - Wappingers Fall NY, US
James R Moulic - Poughkeepsie NY, US

International Business Machines Corporation - Armonk NY

G06F 15/00

702185

Systems, methods and program codes are provided for testing multi-core processor chip structures. Individual processor core power supply voltages are provided through controlling individual power supplies for each core, in one aspect to ensure that one or more cores operate at clock rates in compliance with one or more performance specifications. In one example, a first power supply voltage supplied to a first processing core differs from a second core power supply voltage supplied to a second processing core, both cores operating in compliance with a reference clock rate specification. Core power supply voltages may be selected from ordered discrete supply voltages derived by progressively raising or lowering a first supply voltage, optionally wherein the selected supply voltage also enables the core to operate within another performance specification.

7495519, Feb 24, 2009

Apr 30, 2007

11/742018

Dae Ik Kim - Fishkill NY, US
Jonghae Kim - Fishkill NY, US
Moon Ju Kim - Wappingers Falls NY, US
James R. Moulic - Poughkeepsie NY, US
Hong Hua Song - Beijing, CN

International Business Machines Corporation - Armonk NY

G01R 23/00
H03B 5/24
H03K 3/03

331 44, 331 57, 331 64

System and method are provided for continually monitoring reliability, or aging, of a digital system and for issuing a warning signal if digital system operation degrades past a specified threshold. The technique includes implementing a ring oscillator sensor in association with the digital system, wherein logic and/or device percent composition of the ring oscillator sensor mirrors percent composition thereof within the digital system. Counter logic is coupled to the ring oscillator sensor for converting outputted count signals to an oscillation frequency, and control logic is coupled to the counter logic for periodically evaluating oscillation frequency of the ring oscillator sensor and generating a warning signal indicative of reliability degradation if at least one of: (i) a measured or estimated oscillation frequency is below a warning threshold frequency; or (ii) a measured or estimated rate of change in a difference between measured oscillation frequencies exceeds an acceptable rate of change threshold.

7821110, Oct 26, 2010

May 11, 2007

11/747342

Dae Ik Kim - Fishkill NY, US
Jonghae Kim - Fishkill NY, US
Moon Ju Kim - Wappingers Falls NY, US
Choongyeun Cho - Hopewell Junction NY, US

International Business Machines Corporation - Armonk NY

H01L 23/552

257659, 257297, 257422

Back end of line (BEOL) circuit structures and methods are provided for blocking externally-originating or internally-originating electromagnetic interference. One such BEOL circuit structure includes one or more semiconductor substrates supporting one or more integrated circuits, and one or more BEOL layers disposed over the semiconductor substrate(s). At least one BEOL layer includes a conductive pattern defined at least partially by a plurality of elements arrayed in a first direction and a second direction throughout at least a portion thereof. The plurality of elements are sized and positioned in at least one of the first and second directions to block electromagnetic interference of a particular wavelength from passing therethrough. In one implementation, a first conductive pattern of a first BEOL layer polarizes electromagnetic interference, and a second conductive pattern of a second BEOL layer blocks the polarized electromagnetic interference.

7853808, Dec 14, 2010

Jan 18, 2007

11/624333

Dae Ik Kim - Fishkill NY, US
Jonghae Kim - Fishkill NY, US
Moon J Kim - Wappingers Fall NY, US
James R Moulic - Poughkeepsie NY, US

International Business Machines Corporation - Armonk NY

G06F 1/26

713300, 713310, 713320, 713321, 713322, 713323, 713324, 713330

Systems, methods and program codes are provided for selectively adjusting multi-core processor chip structure individual processor core power supply voltages through controlling individual power supplies for each core, in one aspect to ensure that one or more cores operate at clock rates in compliance with one or more performance specifications. Nominal power supply voltage is supplied to a first processing core, and a second core power supply voltage greater or lower than the nominal power supply voltage is supplied to a second processing core, both cores operating in compliance with a reference clock rate specification. The second power supply voltage may be selected from ordered discrete supply voltages derived by progressively lowering the nominal supply voltage, optionally wherein the selected supply voltage also enables the second core to operate within another performance specification.

7883869, Feb 8, 2011

Nov 30, 2007

12/312903

Jingyue Ju - Englewood Cliffs NJ, US
Dae Hyun Kim - New York NY, US
Lanrong Bi - New York NY, US
Qinglin Meng - New York NY, US
Xiaoxu Li - New York NY, US

The Trustees of Columbia University in the City of New York - New York NY

C12P 19/34
C12Q 1/68
C07G 3/00
C07H 21/04
C07H 19/04

435 911, 435 6, 435 912, 536 41, 536 231, 536 243, 536 2433, 536 253, 536 266

This invention provides a process for sequencing single-stranded DNA by employing a nanopore and modified nucleotides.