Resumes
Resumes

Chao Ma
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Chao Ma
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Chao Ma
View pageLocation:
United States

Chao Ma
View pageLocation:
United States

Chao Ma Los Angeles, CA
View pageWork:
UWMadison & UCLA
Sep 2010 to 2000
Research Assistant (Pulsed Laser Micro Polishing)
UCLA
Sep 2014 to Dec 2014
Teaching Assistant (Rapid Prototyping and Additive Manufacturing)
UCLA
Sep 2012 to Jun 2013
Teaching Assistant (Manufacturing Processes)
UWMadison
Mar 2011 to Mar 2012
Research Assistant (Metal Matrix Nanocomposites)
UWMadison
Mar 2011 to Mar 2012
Research Assistant (Thin Film Micro Sensors)
Sep 2010 to 2000
Research Assistant (Pulsed Laser Micro Polishing)
UCLA
Sep 2014 to Dec 2014
Teaching Assistant (Rapid Prototyping and Additive Manufacturing)
UCLA
Sep 2012 to Jun 2013
Teaching Assistant (Manufacturing Processes)
UWMadison
Mar 2011 to Mar 2012
Research Assistant (Metal Matrix Nanocomposites)
UWMadison
Mar 2011 to Mar 2012
Research Assistant (Thin Film Micro Sensors)
Education:
University of California
Los Angeles, CA
2012 to 2015
Ph.D. in Mechanical Engineering
University of Wisconsin-Madison (UW-Madison)
Madison, WI
2010 to 2012
M.S. in Mechanical Engineering
Tsinghua University
2007 to 2010
B.A. in Economics
Tsinghua University
2006 to 2010
B.S. in Mechanical Engineering
Los Angeles, CA
2012 to 2015
Ph.D. in Mechanical Engineering
University of Wisconsin-Madison (UW-Madison)
Madison, WI
2010 to 2012
M.S. in Mechanical Engineering
Tsinghua University
2007 to 2010
B.A. in Economics
Tsinghua University
2006 to 2010
B.S. in Mechanical Engineering
Skills:
MANUFACTURING<br/>Laser material processing<br/>Additive manufacturing<br/>Surface coating<br/>Composite fabrication<br/>SEMICONDUCTOR PROCESS<br/>Lithography<br/>Et... (dry and wet)<br/>Physical vapor deposition (evaporation and sputtering)<br/>Chemical vapor deposition<br/>Electrodepositi... AND FAILURE ANALYSIS<br/>Optical microscopy<br/>Scanning electron microscopy (SEM)<br/>Transmission electron microscopy (TEM)<br/>X-ray diffraction (XRD)<br/>Energy dispersive X-ray spectroscopy (EDS/EDX)<br/>X-ray computed tomography (X-ray CT)<br/>Dynamic light scattering (DLS)<br/>Atomic force microscopy (AFM)<br/>White light interferometry (WLI)<br/>Hardness test<br/>Tensile test<br/>Corrosion test<br/>FINITE ELEMENT ANALYSIS<br/>Ansys<br/>Comsol<... DESIGN<br/>Solidworks<br/>Auto...